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Identifying Peaks in X-Ray Diffraction Data: A Step-by-Step Guide | MOF peak finding | 2023

In this video, we will guide you through the process of identifying peaks in X-Ray Diffraction data. X-Ray Diffraction (XRD) is a powerful analytical tool for characterizing the structure of materials, including metal-organic frameworks (MOFs). The XRD pattern consists of a series of peaks that correspond to the distances between the atoms in the material's crystal structure. Understanding how to identify peaks in XRD data is crucial for accurate material characterization. In this step-by-step tutorial, we will demonstrate how to perform MOF peak finding in XRD data. We will show you how to extract the relevant data, plot the XRD pattern, and identify the peaks using peak-finding algorithms. By the end of this video, you will have a solid understanding of how to perform peak finding in XRD data and be well on your way to characterizing the structure of your material of interest. So, whether you are a materials scientist, chemist, engineer, or a student, this video is for you. Tune in now to start learning about XRD peak finding!