Скачать с ютуб Meeting the Challenges of ISO26262 Using Tessent In-System Test, by Lee Harrison в хорошем качестве

Meeting the Challenges of ISO26262 Using Tessent In-System Test, by Lee Harrison

A growing proportion of the modern-day automotive electronics are there to support new advanced driver-assistance systems (ADAS). The demands of safety-critical ADAS systems introduce new challenges to semiconductor designers in meeting functional safety requirements defined by the ISO 26262 standard. This webinar will talk about how In-System DFT technologies can be leveraged to meet the ISO 26262 functional safety requirements and how they can support modern In-Life automotive requirements. BIO: Lee Harrison is Automotive IC Solutions Manager, at Siemens EDA. He has over 20 years of industry experience with Siemens Tessent test, safety and security products, with a focus on automotive, Lee is working to ensure that current and future test, safety, security and analytics requirements of Siemens’s automotive customers are understood and met. Lee received his BEng in MicroElectronic Engineering from Brunel University London in 1996 https://eda.sw.siemens.com/en-US/