Скачать с ютуб Expanding Robust High-Yield Design Techniques from Circuit to EM в хорошем качестве

Expanding Robust High-Yield Design Techniques from Circuit to EM

A successful design does not simply meet the specifications. When manufactured, especially in big quantities, variation in the components and variation in the manufacturing process parameters around their nominal values result in final products, most of which do not meet these design specifications. Therefore, having powerful statistical design tools is crucial to ensure robustness and high manufacturing yield. This presentation (along with demonstrations and real-life case studies) illustrates unique design methodologies that help designers produce robust designs with first pass and high yield. This eliminates design iterations, saves an enormous amount of time and money, and enables companies to be first to market and gain a competitive edge. Topics include: • Design of Experiments (DOE) • Yield and Yield Sensitivity Histograms (YSH) • Extending the techniques to include both circuit and EM effects using Advanced Design System (ADS) and RFPro. Speaker: Jack Sifri, Keysight Technologies, MMIC/Module Design Flow Specialist Apply for a Free Trial of ADS at: https://www.keysight.com/find/ads-eva...