Скачать с ютуб Common scan clock generation methods in Tessent SSN (Streaming Scan Network) - TESSENT TEST в хорошем качестве

Common scan clock generation methods in Tessent SSN (Streaming Scan Network) - TESSENT TEST

Presentation by Tessent Test recorded at U2U North America 2023 Presenter - RON PRESS Director of Technology Enablement for Tessent | Siemens EDA Ron Press is Director of Technology Enablement for Tessent at Siemens EDA. As a 30-year veteran of the test and DFT industry, Ron has presented seminars on DFT and test throughout the world. He is a member of the International Test Conference (ITC) Steering Committee. a Golden Core member of the IEEE Computer Society and a Senior Member of IEEE. Ron has patents on reduced-pin-count testing, glitch-free clock switching and on 3D DFT. Ron started his work in the test industry at Raytheon Company working on test and consulting throughout the company on test and built-in test. He co-developed the Testability Design Rating System (TDRS) for the US Air Force and received the Raytheon inventor’s award for a built-in test analysis system. Ron led the development of a state-of-the-art RF/digital tester at Harris RF starting in 1995. He has been with Siemens since 1997. ______________________________________________________________________ ABOUT TESSENT SILICON LIFEYCYCLE SOLUTIONS Tessent Silicon Lifecycle Solutions (formerly Mentor Graphics/UltraSoc) is a division of Siemens EDA (Siemens Digital Industries Software). Tessent are widely recognized as the industry market leader in delivering design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle. Tessent solutions help customers address their debug, test, yield, safety, security and optimization requirements for today’s most complex SoCs. Tessent solutions fall into 2 key categories, Tessent Test and Tessent Embedded Analytics. TESSENT TEST | Design for Test (DFT) and Yield Learning DFT and yield learning products for logic, memory and mixed-signal devices. The Tessent Test product suite provides comprehensive silicon test and yield learning applications that addresses the challenges of manufacturing test, debug, and yield ramp. TESSENT EMBEDDED ANALYTICS | SoC Debug and Analytics Tessent Embedded Analytics provides solutions for real-time debug and post-deployment analytics for RISC-V-based and other complex SoCs. _____________________________________________________________________ LEARN MORE Visit the Tessent website: www. https://eda.sw.siemens.com/en-US/ic/t... Email: [email protected]